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Added available_device in test_classification_report (#3335) #3342
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f3f922f
Added available_device in test_classification_report (#3335)
HyeSungP a62a003
Merge branch 'pytorch:master' into test_classification_report
HyeSungP b763027
Refactor test_classification_report
HyeSungP c98daa7
Merge branch 'master' into test_classification_report
vfdev-5 b3daf5a
Merge branch 'master' into test_classification_report
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Let's refactor
_test_integration_multiclass
test such that we could call it in usual and distributed configs. It is not good to copy-paste the code. Same for the second test method.Uh oh!
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@vfdev-5 Thank you for your advice! So, should I refactor
_test_integration_multiclass
and_test_integration_multilabel
to extract the common logic and make it reusable for both the usual and distributed configurations?There was a problem hiding this comment.
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yes, we should extract the common code that could be used with 1) the new test you have written with
available_device
and 2) distributed test.There was a problem hiding this comment.
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@vfdev-5 Hello! I have made a new commit. Could you check it for me?